Surface Profiling Example Wear Track, Scratch Depth and Pile Up Measurement Example

Surface profiling and
features measurement

Using AEP profilers — contact and/or optical based techniques AEP metrology can virtually do Surface profiling such as defect measurement, surface feature analysis etc. for any type of surface.

Following are recommendations for choice of technique

Optical Profilometer NanoMap-O

For product information click here.

Contact Profilometer NanoMap-LS

For product information click here.

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Contact + Optical Profilometer NanoMap-D

For product information click here.