Nano Tribometer NT-30UNIVERSAL NANO TESTER EXPANDS NANOTECHNOLOGY ANALYSIS

UNT-30 allows to do indentation and scratch in ultra-nano, nano and micro scale on same platform. With several new features and advanced high precision, the silicon valley design takes nanotechnology a step further.


Ultra Nano, Nano & Micro range Interchangeable test heads 3D high resolution image Various lower Drives Environmental Options
Close loop controls Sturdy platform Insitu Sensors FingerPrint curve Software
  Applications Computational power Misc. features  

Ultra Nano, Nano and Micro Range

Modular design to maintain high resolution across entire range

Modular based construction allows UNT-30 to control forces from nN to 30N on same platform.

Ultra Nano Load Range - upto 10mN
Nano Load Range - upto 500mN or 1000mN
Micro Load Range - upto 30N

Interchangeable test heads

Modular design allows to do several tests on one platform

NT-30 offers several complementing techniques on same platform. It takes less than 5 minutes to convert a scratch tester to a nanoindenter to a nanotribometer. This enables users to economically comprehensively characterize the material/coating etc.

TOP

Indentation head

Indentation headCalculate hardness and modulus of thin films

Indentation is a century old technique where a sharp metal is indented on a test area to calculate hardness and Young's modulus of the sample. Historically after the indent the dimension of the indent was measured to calculate hardness of sample. This introduced artifacts and error in data analysis.

UNT-30 uses insitu force and displacement sensors to generate force displacement curve that is used to calculate hardness and Young's modulus automatically without the need to measure the indent dimension. Ultra precise electromagnetic actuators to apply force and multiple capacitance and lvdt sensors are used to measure displacement with very high accuracy. Tester has negligible thermal drift and compliance in Z direction. Indents can be done on micro scale using rockwell, brinell, Vicker's and on nano scale using berkovich, cube corner etc. tips.

The choice of force range (ultra nano, nano or micro) is dictated by coating thickness and surface roughness.

Ultra Nano indenter
Nano indenter Range
Micro Indenter Range

- upto 10mN force
– upto 500mN force
– upto 30N force (upgradeable with higher range)

Few features

Scratch head

Calculate adhesion and hardness of thin films

Scratch HeadScratch test is done to calculate adhesion and scratch hardness of coating or films. The test involves moving a sharp tip, typically a diamond tip, across the sample with controlled load profile (constant or increasing). The force at which coating breaks is reported as adhesion of coating.

UNT-30 Scratch head allows to scratch sample with various easy to interchange upper tips. Multiple insitu data such as friction, acoustic emission, down force, displacement is monitored to precisely calculate adhesion or scratch hardness value of the coating or material. The tests can be done in linear, rotary, spiral and in customize motions.

Nano scratch – upto 1000mN force.
Micro scratch – upto 30N force (upgradeable with higher range)

Common features -

TOP

3D High Resolution Images

Inline imaging to generate atomic level images automatically

Inline imaging option to locate and image previously impossible to locate the nano indent or nano scratch marks automatically. Depending upon the test or the mechanical head installed an imaging option can be chosen. Sample automatically moves between imaging and mechanical heads.

3d High Res Images

High Magnification
Microscope

With Multiple objectives mounted on automatic or manual turret that can take high resolution colored picture and videos.

3D Contact Profilometer

Contact Stylus based profilometer with both tip and stage scan to generate 2D and 3D images with high reliability and without any material surface requirement.

Optical Profilometer

Non contact White light interferometer with high intensity LED allows to image sample with < 0.4% to 100% reflectivity.

AFM

Atomic force microscope with all standard modes such as contact and non contact mode to generate high resolution atomic scale images.

Platform Design

Sturdy design, minimal thermal drift, clean room compatible

To allow analysis at nano level, NT-30 offers cut-off environment. NT-30 is based on a strong sturdy platform that uses granite, anti dampening cast iron, optically flat reference discs, antivibration table, acoustic enclosure etc. High grade electronics from silicon valley allow for high data processing speeds. Fine finish, clean room compatible, low energy compliant, small foot print, multiple cameras, led lighting on the platform makes this platform an ideal platform for various nanotechnology studies.

Various lower drives

Replicate any motion to bring test close to real life

It takes less than 5 minutes to interchange linear drive to a rotary drive. Multiple independent drives allows to create any motion. For eg. User can do scratch test in linear, zig zag, rotary or spiral motions.

TOP

Environmental Options

Testing condition close to real life scenario

UT-3000 comes with close loop environmental control options. The wide range of computer controllable temperature ranges from -150C to 1500C, 5 to 95% RH . These chambers allow lab results to reproduce in field and also to design products considering different geographical location into consideration.

Close Loop Controls

Ensures high reproducibility and repeatability

UT-3000 uses multi mode real time Z down force control. Tests can be done on flat or non flat samples as down force is controlled during the test. All velocities, stroke length, temperature, humidity etc are controlled in close loop to ensure data repeatability and reproducibility.

Study Platform

No vibrations, clean room compatible

To allow analysis at nano level, NT-30 offers cut-off environment. NT-30 is based on a strong sturdy platform that uses granite, anti dampening cast iron, optically flat reference discs, anti-vibration table, acoustic enclosure etc. High grade electronics from silicon valley allow for high data processing speeds. Fine finish, clean room compatible, low energy compliant, small foot print, multiple cameras, led lighting on the platform makes this platform an ideal platform for various nanotechnology studies.

TOP

In-situ Sensors

Multiple parallel data to increase result confidence

UT-3000 uses multi sensing technology to measure various data insitu during the test. Sensors such as acoustic emission, electrical contact resistance, down force, friction force, wear, displacement, humidity, temperature, velocity, stroke lengths, motion direction, images are all recorded and saved on same data file automatically. User can change the frequency of data collection to reduce file size if needed.

Speed/Load Graph

Finger Print Curve

Automatic generation of Friction vs velocity/load curve

To reduce guess work or to give a complete picture UT-3000 give users a starting point for any tribology test. It comes with standard recipe that allows automatic friction vs velocity/load curve generation at various environmental conditions. Tester automatically changes load and velocity during the test and produces the curves automatically. This curve should be used as a starting point for further specific experimental setups.

Software

A good complement to a strong platform

Tester comes with latest windows based OS. It has an intuitive easy to run interface. With one click same area of sample moves between test and imaging head. After the data is collected, images are analyzed using powerful imaging software. Few features of software package is listed below

TOP

Misc. features

Contact us for more information

The current description doesn't list all new exciting features. The tester also has several other features such as tribology head, advanced insitu sensors such as acoustic emission, dynamic liquid circulation, vacuum chambers, pH probes, universal holders etc. Please contact us for more detailed information.